Deadline: April 15
The C.E. Taylor Award shall be bestowed upon an SEM member who demonstrates both technical excellence in optical stress analysis and good citizenship within SEM.
SEM members are eligible. No individual shall receive the award more than once; the award shall be given biannually, provided that a suitable candidate is identified; Technical excellence in optical stress analysis is intended to be all encompassing, where optical analysis is to be taken in its broadest sense.
For More Information: http://www.sem.org/HON-Taylor.asp